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Instrument Semi-Automatic Contactless Wafer Detector:HS-NCS-200SA

Country/Region china
Company henergysolar limited
Categories Optical Measuring Instruments
Telephone 73847489
ICP License Issued by the Chinese Ministry
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    Instrument Semi-Automatic Contactless Wafer Detector:HS-NCS-200SA

    Products Brief:

    Semi-Automatically, non-contact measurement of wafer thickness, TTV ,bow,Point and flatness.Portable and easy to set-up, the Proforma 300/G measures all wafer materials including Silicon, Gallium-Arsenide, Indium-Phosphide and wafers mounted to sapphire or tape.the powerful software can test all the data above within several seconds,all the design according to SEMI standard and the ASTM,make sure the data can be easily unify. the system can used for several sample size,like 75 mm, 100 mm, 125 mm, 150 mm, 200 mm

    Product's Feature:

    Non-contact Measurements.

    Semi-automation system, can improve the measure thoughput.
    Can be used on all wafer materials including: Silicon
    Gallium-ArsenideIndium PhosphideGermanium.
    Thickness and TTV values are obtained by placing the wafer between non-contact capacitance probes.
    Thickness and TTV values are indicated on the high resolution LCD display.
    Provides High Performance at Low Cost.
    Menu-driven for Fast, Easy Setup.
    High-resolution LCD Display.
    RS-232 Output Port to PC.
    Parallel Port for Printer.
    Portable and Easy to Set Up
    provides the user precise non-contact measurements at critical points throughout the wafer manufacturing process.
    On-board Microprocessor for Accurate, Repeatable Measurements.
    Teflon Wafer Stage for Easy, Non-abrasive Positioning.


    Technique Specification:

    Wafer Sizes: 75 mm, 100 mm, 125 mm, 150 mm, 200 mm

    Measurement Range: 1mm standard [1.7 mm Extended]
    Thickness Accuracy: +/-0.25um
    Repeatability:
    0.050um

    TTV Accuracy:+/-0.05um

    Quality Instrument Semi-Automatic Contactless Wafer Detector:HS-NCS-200SA for sale
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