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XRF Film Thickness Spectrometer/Coating Film Thickness Gauge/Non-destructive Alloy Composition Analyzer

Categories ICP Emission Spectrometer
Brand Name: LONROY
Place of Origin: Guangdong, China
customized support: OEM, ODM, OBM
warranty: 1year
Model Number: LR-1610D
Product name: Coating thickness gauge
MOQ: 1
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XRF Film Thickness Spectrometer/Coating Film Thickness Gauge/Non-destructive Alloy Composition Analyzer

XRF film thickness spectrometer/Coating film thickness gauge/Non-destructive alloy composition analyzer
1.Product introduction:
LR-1610D spectral thickness gauge can analyze the plating solution while analyzing the thickness of various coatings.It is applicable to super large pieces,heterosexual groove pieces,micro intensive multi-point testing or automatic detection of a large number of small parts one by one,such as print circuit boards(PCB),lead supports, sanitary products,etc
2.Feature
Automatic Programmable automatic displacement platform, unattended ,automatic sample detection;High efficiency detection of hundreds of sample points can be realized with one program Intelligent Realize automatic Al image intelligent searching,and program files to automatically match test positions. It has obvious advantages in the face of testing large quantities of similar samples. Online According to customer needs, online inspection of production line can be customized to provide an overall solution for online inspection for Industry 4.0, improve inspection efficiency and realize automatic intelligent factory.
XRF film thickness spectrometer/Coating film thickness gauge/Non-destructive alloy composition analyzer
3.characteristic
1.Reliable high performance High test accuracy and stability, reduce waste and eliminate dead time while providing high quality
2.Cost-effective Manufacturing process upgrade, more cost-effective, greatly saving use costs
3.Advanced detection technology Highly integrated vertical optical path system,using advanced spectrum analysis technology and image recognition algorithm, realizes accurate, fast, intelligentand automatic detection to meet theneeds of enterprises
4.Longerservice life Modular design, focusing on energy saving, and equipped with automatic sleep mode to extend the servicelife
5.Core EFP algorithm Theadvanced EFP algorithm is not only accuratefor multi-layertesting and convenient for calibration, but also solves the detection problems of multi-ayeralloy, upperand lowerelement repeated coatingand penetration layer
6.Four-Focus integrated device Equipped with highly integrated fourfocal technology, it can measure the height and height ofthegroove with a maximum depth of90mm
7.Up-bottom optical Measure The division of management between the upperand lower computers enables fast, accurate,stable and efficient measurement ofsuper large workpieces
8.Strong applicability Accurately measure thethickness ofvarious metal coatings and analyze the plating solution
XRF film thickness spectrometer/Coating film thickness gauge/Non-destructive alloy composition analyzer

Model

Items


XD-1000

Product configurationABC

ElementAnalysis


Cl(17)-U(92)


S(16)/Al(13)-U(92)


Thickness-ElementAnalysis


Cl(17)/Li(3)-U(92)


L(3)-U(92)


EFP algorithm


standard

Thickness&Element Analysis ability

Simultaneous analysis of

5 coatings and 10 elements


Simultaneous analysis of 23 coatings and 24elements

Detection ofthe same

elementin different layers


standard


Software


User-friendly software, Easy-operation,Self-diagnoses system


X-ray Tube


Micro-focusingX-ray Tube

Micro-focusingenhanced

X-ray tube


Collimator


φ0.2mm

φ0.5mm,(One ofTwo)


φ0.2mm

(φ0.1mmCan beselected)

Standard;φ0.2mm;

φ0.5mmφ0.3mmφ0.2mm

φ0.1mm*φ0.3mm

Can be selected


Micro-Focusing Spot


Spot diffusivity 10%(in normal measuring distance)


Measuring Distance

Distance correction function, differentdistance sample can be tested in the same test condition,

0-90mm measuring distance


Sample observation


1/2.7"colorCCD,with zoom function


Focus mode


High sensitivity lens, manual focusing


Magnification


Optical 38-46x, digital amplification 40-200 times


Detector


High efficiency proportional counter

Standard:Si-PIN semiconductor detector(SDD can beoptional)

Platform move


Manual Control

Automatic Highprecision XY stage

ManualControl


Dimension


550mm*760mm*635mm


Zmovingrange


145mm


Xy moving range


100mm*150mm


210mm*230mm


100mm*150mm


Weight


100KG


120KG


100KG

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